Surface defects are detected using AI models and computer vision technology, while diameter and lump/neckdown detection use telecentric optical technology.
The minimum detectable surface defect size varies with lens magnification, while the minimum detectable lump/neckdown height depends on the sampling rate.
Typical values are:
For specific applications, please refer to the product selection guide and the Surface Defect Inspection System Brochure, or contact our sales/technical support team for configuration recommendations.
Currently, the maximum supported line speed is 300 m/min. The actual maximum speed depends on the system configuration.
Provides end-to-end support from product selection to production line operation through on-site guidance and after-sales technical support.